Optical Characterization of Sb Doped Se-In Glassy System and Its Applications in Optical Devices
Abstract
Thin films of a-Se75In25-xSbx (where x = 0, 5, 10, and 15) glassy alloys are prepared by thermal evaporation technique in the presence of vacuum on a well-cleaned glass substrate. The transmittance of as-deposited thin films is measured in the wavelength range 400-2100 nm. The optical parameters like refractive index (n), extinction coefficient (k), absorption coefficient (?), real and imaginary dielectric constants (?' & ?") have been calculated in the measured range of wavelength, by the Swanepoel method using optical transmission data. The optical band gap (Eg) has also been calculated by Tauc’s relation. It is observed that various optical parameters show a discontinuity at x = 10 suggesting a mechanically stabilized structure at this concentration and can be explained on the basis of the chemically ordered network (CON) model and the topological model. These glassy systems can be used in various optical device applications.